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SEM Nano-Probe Station

The ZEPTOOLS SEM Nano-Probe Station is a vacuum-compatible, three-axis positioning and manipulation platform for in-situ SEM applications. Multiple three-axis probe stages can be installed in one SEM chamber and configured with electrical probes, fiber-optic probes, nanotweezers, diamond nanoindenters, microinjectors, and other compatible manipulation or measurement heads.


>   Description

Key features

  • Three-axis probe-stage architecture

  • Each three-axis stage consists of three single-axis motion stages

  • Multiple three-axis probe stages can be installed in one SEM chamber

  • Precise positioning in three-dimensional space

  • Compact structure with high rigidity

  • Large travel range described by the manufacturer; numerical value not published

  • Zero-backlash flexible-hinge guidance system

  • Piezoelectric ceramic displacement platform

  • Internal position feedback available on request

  • Compatible with high-vacuum environments

  • Interchangeable manipulation and measurement heads

  • Base designed for SEM/FIB compatibility

Supported manipulation and measurement heads

  • Electrical probes

  • Fiber-optic probes

  • Nanotweezers

  • Diamond nanoindenters

  • Microinjectors



Standard configuration

  • Probe body

  • Base compatible with SEM/FIB

  • Vacuum flange

  • Probe controller

  • Control handle



Optional configurations

  • Cryogenic sample stage

  • High-temperature sample stage

  • Fiber-optic clamps

  • Fiber-optic vacuum feedthroughs

  • EBIC kit


Applications

  • Nanomaterial manipulation

  • Electrical-property measurement of nanodevices

  • Optoelectronic-property measurement of nanodevices

  • Biological-cell and DNA manipulation


>   Products
SEM Nano-Probe Station for In-Situ Manipulation and Measurement
Prod#
SEM Nano-Probe Station
Description
In-Situ SEM Solution
Unit
System
Price
P.O.R
Order/Quote
Qty: Add to cart
Prod# Description Unit Price Order/Quote
SEM Nano-Probe Station In-Situ SEM Solution System P.O.R Qty: Add to cart
Frequently asked questions

How can I request a quotation?

Provide EMART with the SEM or FIB model, chamber and stage details, number of probes, required probe heads, sample geometry, electrical or optical measurement needs, temperature requirements, feedthrough availability, and installation location. EMART will confirm the suitable configuration with the manufacturer..