ZEM Series SEM-EDS Integration System
The ZEPTOOLS ZEM Series Desktop SEM–EDS Integration System combines sample-morphology observation with elemental analysis in a compact platform. It integrates a tungsten-filament desktop scanning electron microscope with secondary-electron and backscattered-electron detectors and an Oxford Xplore Compact 30 EDS system.
Energy Spectrometer Parameters
Integrated Oxford Xplore Compact 30 EDS Analysis System with a Super ATW window and a 30mm² active area
Resolution better than 129eV (at MnKα) without liquid nitrogen cooling
Elemental analysis range: B5-Cf98
Point, line, and area scanning analysis
Fully Chinese software interface with the option to switch between Chinese and English
SEM Host Machine Features
Vacuum Separation Technology: Utilizes a unique vacuum design where the electron gun and sample chamber have separate vacuums, allowing for sample change in less than 1 minute.
Extra-Large Sample Chamber: Provides a larger sample storage space for convenient user operation.
Ultra-High Resolution: Achieves a maximum magnification of 360,000 times with a resolution of 5nm at 20kV.
Standard Equipped Deceleration Mode: Allows for the observation of weakly conductive samples without gold sputtering.
In-Chamber Camera: The sample chamber is equipped with a high-definition camera for real-time monitoring of sample changes during in-situ experiments.

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| SEM–EDS Integration System |
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| ZEM Series Desktop Scanning Electron Microscope |
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| each |
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| Qty: Add to cart |
| Prod# | Description | Unit | Price | Order/Quote |
|---|---|---|---|---|
| SEM–EDS Integration System | ZEM Series Desktop Scanning Electron Microscope | each | P.O.R | Qty: Add to cart |
How can I request a quotation?
Contact EMART with your sample materials, specimen dimensions, elements of interest, expected concentration range, required analysis modes, desired SEM detectors, laboratory location, and training requirements. EMART will confirm the suitable configuration with the manufacturer.