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ZEM Series SEM-EDS Integration System

The ZEPTOOLS ZEM Series Desktop SEM–EDS Integration System combines sample-morphology observation with elemental analysis in a compact platform. It integrates a tungsten-filament desktop scanning electron microscope with secondary-electron and backscattered-electron detectors and an Oxford Xplore Compact 30 EDS system.


>   Description

Energy Spectrometer Parameters

  • Integrated Oxford Xplore Compact 30 EDS Analysis System with a Super ATW window and a 30mm² active area

  • Resolution better than 129eV (at MnKα) without liquid nitrogen cooling

  • Elemental analysis range: B5-Cf98

  • Point, line, and area scanning analysis

  • Fully Chinese software interface with the option to switch between Chinese and English


SEM Host Machine Features

  • Vacuum Separation Technology: Utilizes a unique vacuum design where the electron gun and sample chamber have separate vacuums, allowing for sample change in less than 1 minute.

  • Extra-Large Sample Chamber: Provides a larger sample storage space for convenient user operation.

  • Ultra-High Resolution: Achieves a maximum magnification of 360,000 times with a resolution of 5nm at 20kV.

  • Standard Equipped Deceleration Mode: Allows for the observation of weakly conductive samples without gold sputtering.

  • In-Chamber Camera: The sample chamber is equipped with a high-definition camera for real-time monitoring of sample changes during in-situ experiments.


Application Cases:



>   Products
ZEM Series SEM–EDS Integration System
Prod#
SEM–EDS Integration System
Description
ZEM Series Desktop Scanning Electron Microscope
Unit
each
Price
P.O.R
Order/Quote
Qty: Add to cart
Prod# Description Unit Price Order/Quote
SEM–EDS Integration System ZEM Series Desktop Scanning Electron Microscope each P.O.R Qty: Add to cart
Frequently asked questions

How can I request a quotation?

Contact EMART with your sample materials, specimen dimensions, elements of interest, expected concentration range, required analysis modes, desired SEM detectors, laboratory location, and training requirements. EMART will confirm the suitable configuration with the manufacturer.