ZEM20 Tungsten Filament Desktop Scanning Electron Microscope
The ZEPTOOLS ZEM20 is a compact tungsten-filament desktop scanning electron microscope designed for reliable, cost-effective microstructural imaging. It offers a stated resolution of 4 nm, magnification up to 360,000×, straightforward operation, stable performance, and an extra-large specimen chamber that supports a broad range of samples and compatible in-situ expansions.
Key featuresTungsten-filament electron source
Stated resolution of 4 nm
Maximum magnification of 360,000×
Compact desktop configuration
Straightforward operation
Stable imaging performance
Extra-large specimen chamber
Supports compatible in-situ expansion stages
Suitable for routine research and industrial inspection
Cost-effective SEM platform for laboratories and educational facilities
Surface-morphology and microstructure observation
Materials-science research
Metals, ceramics, polymers, powders, and coatings
Semiconductor and electronic-component inspection
Battery and energy-material research
Fiber, paper, and filtration-material analysis
Biological and life-science morphology studies
Product development and failure investigation
Industrial quality control
University teaching and laboratory training
In-situ SEM experiments with compatible stages
The ZEM20 uses a tungsten-filament source and is positioned as the cost-effective model for stable routine imaging. The ZEM20 Pro uses a higher-brightness LaB₆ source and is positioned for higher-resolution desktop SEM work. The current public pages state 4 nm resolution for the ZEM20 and 3 nm for the ZEM20 Pro.
Contact EMART with your sample types, required resolution, preferred detectors, analytical requirements, in-situ needs, installation location, and expected usage. EMART will help define the appropriate configuration and provide a quotation.