Key features

• High-brightness lanthanum hexaboride (LaB₆) electron source

• Stated resolution of 3 nm

• Maximum magnification of 360,000×

• Compact desktop SEM platform

• Automatic brightness and contrast adjustment

• Automatic focusing

• Large-area image stitching

• Extra-large specimen chamber

• Supports compatible in-situ expansion stages

• Designed for research and industrial inspection

Applications

• University teaching and scientific research

• Microstructural and surface-morphology characterization

• Semiconductor device inspection and failure analysis

• New-material development and performance studies

• Metals, ceramics, powders, fibers, and functional materials

• Electronic-component inspection

• Biomedical and life-science morphology research

• Industrial quality assurance and failure investigation

• In-situ SEM experiments with compatible stages