Desktop Scanning Electron Microscope | ZEM Ultra Field Emission SEM
Schottky field emission electron source
The pinnacle of scanning electron microscope performance
Schottky field-emission electron source
Resolution better than 2.5 nm
Three-stage independent vacuum design
Large beam current
Extra-large specimen chamber
EDS and EBSD integration support
Compatibility with in-situ functional stages
Micro- and nanoscale surface morphology
Materials and raw-material characterization
Metallographic inspection
Semiconductor and electronic-component inspection
Battery and energy-material research
Fiber and chemical-material analysis
Pharmaceutical and forensic testing
Biological and life-science samples
In-situ SEM experiments with compatible stages
ZEM Ultra Field Emission SEM
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| ZEM Ultra Field Emission SEM |
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| Desktop Scanning Electron Microscope |
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| Qty: Add to cart |
| Prod# | Description | Unit | Price | Order/Quote |
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| ZEM Ultra Field Emission SEM | Desktop Scanning Electron Microscope | each | P.O.R | Qty: Add to cart |
Contact EMART with your sample types, required resolution, preferred detectors, analytical requirements, in-situ needs, installation location, and expected usage. EMART will help define the appropriate configuration and provide a quotation.